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Scanning tunneling microscope
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61	Microsoft PowerPoint - ENGS-AFM [Compatibility Mode] Add to Reading List Source URL: nanofab.caltech.edu Language: English - Date: 2013-01-21 22:21:44 Microscopes Chemistry Scanning tunneling microscope Intermolecular forces Atomic force microscopy Microscopy Canton of Neuchâtel Conductive atomic force microscopy NanoWorld Scanning probe microscopy Science Scientific method
62	Electrons corralled using new quantum tool Add to Reading List Source URL: phys.org Language: English - Date: 2015-05-16 13:14:06 Emerging technologies Nanomaterials Graphene Electron Microscope Whispering-gallery wave Laser Scanning tunneling microscope Physics Condensed matter physics Chemistry
63	Nanotechnology Solutions Partner Park Systems IncOlcott St. Santa Clara, CATel. +Fax. +www.parkAFM.com Park Systems Singapore. No51, Ubi Avenue 1, #06-09A Paya Ubi Industrial P Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2011-11-12 18:00:00 Chemistry Magnetic force microscope Near-field scanning optical microscope Microscopy Park Systems Kelvin probe force microscope Scanning tunneling microscope Microscope Atomic force microscopy Scanning probe microscopy Science Scientific method
64	Dimension FastScan The World’s Fastest AFM Innovation with Integrity Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2013-10-28 06:25:22 Chemistry Atomic force microscopy Magnetic force microscope Microscopy Conductive atomic force microscopy Scanning capacitance microscopy Nanoindentation Scanning tunneling microscope Microscope Scanning probe microscopy Science Scientific method
65	Nanotechnology Solutions Partner Park Systems IncOlcott St. Santa Clara, CATel. +Fax. +www.parkAFM.com Park Systems Singapore. No51, Ubi Avenue 1, #06-09A Paya Ubi Industrial P Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2011-11-12 18:00:00 Chemistry Magnetic force microscope Near-field scanning optical microscope Microscopy Park Systems Scanning tunneling microscope Kelvin probe force microscope Nanometrology Chemical force microscopy Scanning probe microscopy Science Scientific method
66	Application Note 088 High-Resolution Imaging in Different Atomic Force Microscopy Modes John Alexander and Sergei Magonov NT-MDT Development Inc. Tempe AZ USA Add to Reading List Source URL: www.ntmdt.ru Language: English - Date: 2015-03-16 02:50:10 Chemistry Atomic force microscopy Microscopy Scanning tunneling microscope Microscope Vibrational analysis with scanning probe microscopy Magnetic force microscope Scanning probe microscopy Science Scientific method
67	High-Resolution Imaging in Different Atomic Force Microscopy Modes John Alexander and Sergei Magonov NT-MDT Development Inc. Tempe AZ USA • A n operation of AFM microscope in a temperaturestable cabinet facilitates Add to Reading List Source URL: ntmdt.com Language: English - Date: 2015-03-16 03:01:49 Chemistry Atomic force microscopy Microscopy Scanning tunneling microscope Microscope Vibrational analysis with scanning probe microscopy Magnetic force microscope Scanning probe microscopy Science Scientific method
68	A revolutionary step in AFM design Revolution Cartridge for Multi-probe Cartridges. Enables Automated Cantilever Replacement with Full Tuning. Standard AFM Head for traditional single chip probes for traditional AFM ca Add to Reading List Source URL: www.ntmdt.com Language: English - Date: 2014-05-19 02:29:27 Scientific method Kelvin probe force microscope Magnetic force microscope Microscopy Scanning tunneling microscope Cantilever Atomic force microscopy Nanosensors Scanning probe microscopy Science Chemistry
69	High-Resolution Imaging in Different Atomic Force Microscopy Modes John Alexander and Sergei Magonov NT-MDT Development Inc. Tempe AZ USA • A n operation of AFM microscope in a temperaturestable cabinet facilitates Add to Reading List Source URL: www.ntmdt.com Language: English - Date: 2015-03-16 03:01:49 Chemistry Atomic force microscopy Microscopy Scanning tunneling microscope Microscope Vibrational analysis with scanning probe microscopy Magnetic force microscope Scanning probe microscopy Science Scientific method
70	From local Kondo screening to heavy fermion coherence (invited) S. Wirth, S. Ernst, S. Kirchner, C. Krellner, C. Geibel, G. Zwicknagl and F. Steglich Heavy fermion metals are characterized by a variety of relevant energy Add to Reading List Source URL: www.the-conference.com Language: English - Date: 2012-02-09 09:22:17 Heavy fermion Kondo effect Scanning tunneling spectroscopy Superconductivity Kondo Electron Scanning tunneling microscope Kondo insulator Physics Condensed matter physics Matter

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